Improved stability of thin-film resistors
نویسنده
چکیده
Earlier, deeper investigations into the drift behavior of thin-film resistors have shown that the usual methods for predicting drift are incapable of describing the present remarkable differences within a certain R-layer alloy system (for example, CrNi) or those between different alloy systems (for example, CrNi versus CrSi or TaN). In order to come to a more precise model, we have to ignore all available and published models and start again with a different approach based on the general Arrhenius law (references 1 and 2).
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تاریخ انتشار 2016